German company acquires stake in Scientific Visual

16.08.2024

Scientific Visual, a Swiss provider of solutions for the quality control of industrial crystals, has entered a strategic partnership with PVA TePla. Besides the acquisition of a 25 percent equity stake, this partnership allows the latter to expand its existing expertise in metrology and bulk material characterization. The first results of the pilot project are expected in 2025.

Based in Lausanne, Scientific Visual specializes in the inspection of semiconductors and optical materials, particularly focusing on quality control for non-polished sapphire used in various industries. The company provides its clients in Switzerland, China, Japan, the USA, and Europe with advanced scanning technology to visualize defects in materials like sapphire, ruby, glass, and other semiconductor crystals. Their scanners are designed to detect volume defects such as bubbles, cracks, and cloudiness, which helps ensure that only high-quality materials proceed to the next manufacturing processes. By identifying defects early, their systems help reduce waste and improve efficiency.

PVA TePla, has now acquired 25 percent of the shares in Scientific Visual, enabling the company to broaden its existing expertise in the field of metrology and bulk material characterization. Initially, the focus will be on the inspection of silicon carbide (SiC) crystals with the aim of further improving the crystal growth process, the quality of the crystals and the production yield.

The software allows a 3D-representation of bulk defects such as voids and cracks  in entire, as-grown sapphire crystals.

“The collaboration with Scientific Visual marks another milestone in our work on silicon carbide. Our expertise in production as well as in quality testing using our measurement technology methods will be meaningfully expanded by the know-how we have gained and will strengthen our position in the market,” explains Jalin Ketter, CEO of PVA TePla AG.

The global demand for this material will increase significantly over the next few years. Strengthening the development work with the metrology expertise of Scientific Visual is therefore the next logical step. The first results of the collaboration are expected within a year.

"The synergy between Scientific Visual's automated inspection technology for industrial crystals and PVA TePla's industrial production capabilities will enhance the quality of silicon carbide crystals. This partnership is an important step towards leveraging Industry 4.0. We anticipate substantial benefits for the semiconductor industry as a whole", said Ivan Orlov, CEO of Scientific Visual.

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