SwissMapper — Our Newest Advancement in High-Throughput Materials Characterization

29.11.2025

We are excited to introduce SwissMapper, the latest addition to our materials characterization infrastructure. This multimodular, high-throughput analytical platform is engineered to significantly accelerate the discovery, development, and optimization of thin-film materials.

SwissMapper integrates a comprehensive suite of characterization techniques into a single, fully automated instrument, enabling rapid and highly resolved mapping of thin-film libraries with exceptional efficiency:

X-ray diffraction (XRD) with a 2D detector for fast, spatially resolved structural analysis;
X-ray fluorescence (XRF) for quantitative compositional mapping;
Nano-indentation for localized mechanical property characterization;
Four-point probe measurements for electrical conductivity profiling;
Optical microscopy for detailed surface morphology assessment.

Integrated Characterization Platform Unifies structural, compositional, mechanical, and electrical characterization within one automated system, reducing complexity and ensuring consistent measurement conditions across modalities.
High-Speed Multimodal Scanning Collects complementary datasets in a single pass, minimizing sample Handling and enabling reproducible, time-efficient workflows.
Correlated Multi-Modal Mapping Performs full-area characterization of samples up to 4-inch wafers, with all techniques spatially registered on a common coordinate system to support robust data correlation.
Unified Data Architecture Stores all measurement outputs in a single, standardized file format, enabling seamless data fusion, visualization, and quantitative analysis across modalities.
High-Throughput Ready Optimized for combinatorial materials science, process optimization, and statistically rigorous studies through automated, repeatable mapping routines.

SwissMapper’s integrated design establishes a new benchmark for efficiency in thin-film research. By combining rapid acquisition, spatial coherence, and multi-modal characterization, it empowers researchers to navigate complex materials landscapes with unprecedented speed, precision, and insight.

A sincere thank you to the entire team whose creativity, perseverance, and engineering expertise brought SwissMapper to life — and to our early users, who are already generating their first multimodal thin-film maps.

Source: (33) SwissMapper — Our Newest Advancement in High-Throughput Materials Characterization | LinkedIn